PROBE CARD

摘要

PURPOSE: A probe card is provided to control the number of semiconductors to be inspected through one inspection process in response to the variation of the number of semiconductor devices formed on a wafer. CONSTITUTION: A printed circuit board(200) comprises a circuit pattern. A space transformer(300) comprises a first pad and a second pad. The first and second pads perform pitch transformation. A probe unit(400) comprises a plurality of probes and a probe block. The plurality of probes are mounted on the probe block. The probe block unit forms a receiving space of the probe unit. An interposer unit of one probe is opposite to the end of the second support unit. The interposer unit of another probe is opposite to the space between the body unit and the second support unit.