发明名称 INTEGRATED OPTICAL INSPECTION APPARATUS
摘要 PURPOSE: An integrated optical inspection apparatus is provided to obtain an image about a circuit pattern part without the exposing of a solder resist part. CONSTITUTION: An integrated optical inspection apparatus comprises a photographing part(150), a lighting part(160) and a substrate support part(170). The photographing part takes a photograph of a printed circuit board(1). The lighting part examines the light in the printed circuit board. The substrate support part while photographing supports the printed circuit board of the printed circuit board. The lighting part comprises a first lighting part and a second lighting part. The first lighting part materially examines the light of the other color with the color of the solder resist part.
申请公布号 KR20100046813(A) 申请公布日期 2010.05.07
申请号 KR20080105838 申请日期 2008.10.28
申请人 WARPVISION INC. 发明人 KIM, HONG YOU;SONG, KEE HYO
分类号 G01B11/24;H05K13/08 主分类号 G01B11/24
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