发明名称 TOPCOAT COMPOSITION FOR PROTECTIVE LAYER OF RESIST FILM AND METHOD FOR FORMING PATTERN USING THE COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide a topcoat composition for a protective layer of a photoresist film, the composition having enhanced function of a compound having a Si atom and/or a F atom to be used, together with an alkali-soluble resin in a liquid immersion exposure photoresist film, and to provide a method for forming a pattern, using the topcoat composition for a protective layer of a resist film. <P>SOLUTION: The topcoat composition for a protective layer of a resist film contains an alkali-soluble resin as a component (A), a compound having a Si atom and/or a F atom as a component (B), and a solvent expressed by formula (1) as a component (C). In formula (1), R<SB>1</SB>represents an alkylene group having 2 to 3 carbon atoms, and R<SB>2</SB>represents an alkyl group having 3 to 4 carbon atoms. A method for forming a pattern is also disclosed. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010102048(A) 申请公布日期 2010.05.06
申请号 JP20080272514 申请日期 2008.10.22
申请人 FUJIFILM CORP 发明人 HIRAOKA HIDETOSHI
分类号 G03F7/11;G03F7/38;H01L21/027 主分类号 G03F7/11
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