发明名称 DATA TRANSFER SYSTEM AND LSI TESTER
摘要 <P>PROBLEM TO BE SOLVED: To provide a data transfer technology capable of shortening a time required for setting data into a register by a control device. Ž<P>SOLUTION: This system includes: a plurality of semiconductor devices having a plurality of channels; a data transfer control part having a plurality of registers, for transferring data set in the registers to the semiconductor devices; and a control device for setting data successively into the plurality of registers. The plurality of registers include a plurality of first registers for setting data corresponding respectively to the plurality of channels, and a second register for setting data in common to the plurality of channels of the semiconductor devices. The second register includes a plurality of dummy registers provided corresponding respectively to the plurality of first registers, and a common register onto which data set in the plurality of dummy registers are transferred. The dummy registers are arranged on an address domain continuous to each corresponding first register. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010101786(A) 申请公布日期 2010.05.06
申请号 JP20080274235 申请日期 2008.10.24
申请人 YOKOGAWA ELECTRIC CORP 发明人 SHIBATA WATARU
分类号 G01R31/28 主分类号 G01R31/28
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