| 摘要 |
Provided is a test apparatus that tests a device under test. The device under test includes: a circuit under test; and a switching section that that connects an internal terminal being tested, from among one or more internal terminals of the circuit under test, to external terminals connected to the test apparatus. The test apparatus includes: a measuring section that controls a relay section, which provides a connection or a disconnect between two of the external terminals such that a transmission characteristic of the relay section in a connected state serves as a basis for calculating the transmission characteristic between each external terminal and each internal terminal of the circuit under test, to be in a connected state and measures the transmission characteristic of the relay section via the two external terminals; and a compensating section that compensates a signal to be supplied to the circuit under test via an external terminal and the switching section and/or a signal acquired from the circuit under test via the switching section and an external terminal, based on the measured transmission characteristic of the relay section.
|
