发明名称 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND
摘要 <P>PROBLEM TO BE SOLVED: To provide: a novel polymeric compound useful as a base component of a positive resist composition; a compound useful as a monomer of the polymeric compound; a positive resist composition including the polymeric compound; and a method of forming a resist pattern using the positive resist composition. <P>SOLUTION: The positive resist composition contains a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) containing an acid dissociable, dissolution inhibiting group within the structure thereof and including a specific structural unit (a0) derived from a (meth)acryloyloxy organic acid and a bicyclolactone compound and a structural unit (a2) not corresponding to the structural unit (a0) and derived from an acrylate ester containing a lactone-containing cyclic group. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010101917(A) 申请公布日期 2010.05.06
申请号 JP20080254847 申请日期 2008.09.30
申请人 TOKYO OHKA KOGYO CO LTD 发明人 HIRANO TOMOYUKI;DAZAI NAOHIRO;SHIONO HIROHISA;MATSUMIYA YU
分类号 G03F7/039;C08F120/10;G03F7/004;H01L21/027 主分类号 G03F7/039
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