发明名称 METHOD FOR MANUFACTURING SOI SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To obtain an SOI substrate with sufficient characteristics as one purpose or to reduce variations in characteristics of the SOI substrate due to irradiation conditions of laser light as one purpose in the case of irradiation with laser light. SOLUTION: A single crystal semiconductor substrate is irradiated with accelerated ions to form an embrittled region in the single crystal semiconductor substrate. The single crystal semiconductor substrate and a base substrate are bonded to each other with an insulating layer interposed therebetween. The single crystal semiconductor substrate is separated at the embrittled region and a semiconductor layer is formed over the base substrate. Heat treatment is performed to reduce defects in the semiconductor layer. The semiconductor layer is then irradiated with laser light. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010103505(A) 申请公布日期 2010.05.06
申请号 JP20090216367 申请日期 2009.09.18
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ISOBE ATSUO;MOMO JUNPEI;OKUNO NAOKI
分类号 H01L21/02;H01L21/20;H01L21/265;H01L21/322;H01L27/12 主分类号 H01L21/02
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