发明名称 |
METHOD FOR MANUFACTURING SOI SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To obtain an SOI substrate with sufficient characteristics as one purpose or to reduce variations in characteristics of the SOI substrate due to irradiation conditions of laser light as one purpose in the case of irradiation with laser light. SOLUTION: A single crystal semiconductor substrate is irradiated with accelerated ions to form an embrittled region in the single crystal semiconductor substrate. The single crystal semiconductor substrate and a base substrate are bonded to each other with an insulating layer interposed therebetween. The single crystal semiconductor substrate is separated at the embrittled region and a semiconductor layer is formed over the base substrate. Heat treatment is performed to reduce defects in the semiconductor layer. The semiconductor layer is then irradiated with laser light. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010103505(A) |
申请公布日期 |
2010.05.06 |
申请号 |
JP20090216367 |
申请日期 |
2009.09.18 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ISOBE ATSUO;MOMO JUNPEI;OKUNO NAOKI |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L21/322;H01L27/12 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|