发明名称 Methods of Forming Integrated Circuit Devices Having Vertical Semiconductor Interconnects and Diodes Therein and Devices Formed Thereby
摘要 Methods of forming integrated circuit devices include forming an etch stop layer on a surface of a semiconductor substrate and forming a first interlayer insulating layer on the etch stop layer. The first interlayer insulating layer is patterned to define an opening therein that exposes a first portion of the etch stop layer. This first portion of the etch stop layer is then removed to thereby expose an underlying portion of the surface of the semiconductor substrate. This removal of the etch stop layer may be performed by wet etching the first portion of the etch stop layer using a phosphoric acid solution. A semiconductor region is then selectively grown into the opening, using the exposed portion of the surface of the semiconductor substrate as an epitaxial seed layer.
申请公布号 US2010108971(A1) 申请公布日期 2010.05.06
申请号 US20090498528 申请日期 2009.07.07
申请人 LEE KONG-SOO;KIM KYOUNG-SEOK;PARK SANG-JIN;LEE CHANG-HOON;JEONG JI-HYUN;PARK JAE-HYUN;OH JAE-HEE 发明人 LEE KONG-SOO;KIM KYOUNG-SEOK;PARK SANG-JIN;LEE CHANG-HOON;JEONG JI-HYUN;PARK JAE-HYUN;OH JAE-HEE
分类号 H01L47/00;H01L21/20 主分类号 H01L47/00
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