发明名称 SYSTEM AND APPARATUS FOR FLUORIDE ION CLEANING
摘要 <p>System and apparatuses for utilizing in-situ generated hydrogen fluoride (HF) in a cleaning process. An exemplar)1 system includes a cleaning retort operable at a temperature sufficient to promote an in-situ reaction between a liquid or gaseous haJogenated feedstock and hydrogen gas to form the HF, The system includes a liquid or gaseous halogenated feedstock source and a hydrogen gas source disposed outside the cleaning retort which, upon reaction generate the HF within the cleaning retort. A HF scrubber, disposed within the cleaning retort, is operable to substantially remove residual HF gas formed by the in-situ reaction. An exemplary apparatus includes a cleaning retort having a first region able to hold parts in need of cleaning and a second region operable as a HF scrubber.</p>
申请公布号 WO2010051174(A1) 申请公布日期 2010.05.06
申请号 WO2009US61120 申请日期 2009.10.19
申请人 GENERAL ELECTRIC COMPANY;MANTKOWSKI, THOMAS, E. 发明人 MANTKOWSKI, THOMAS, E.
分类号 B01D53/68;B23P6/00;C23G5/028;F01D25/00 主分类号 B01D53/68
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