发明名称 |
SYSTEM AND APPARATUS FOR FLUORIDE ION CLEANING |
摘要 |
<p>System and apparatuses for utilizing in-situ generated hydrogen fluoride (HF) in a cleaning process. An exemplar)1 system includes a cleaning retort operable at a temperature sufficient to promote an in-situ reaction between a liquid or gaseous haJogenated feedstock and hydrogen gas to form the HF, The system includes a liquid or gaseous halogenated feedstock source and a hydrogen gas source disposed outside the cleaning retort which, upon reaction generate the HF within the cleaning retort. A HF scrubber, disposed within the cleaning retort, is operable to substantially remove residual HF gas formed by the in-situ reaction. An exemplary apparatus includes a cleaning retort having a first region able to hold parts in need of cleaning and a second region operable as a HF scrubber.</p> |
申请公布号 |
WO2010051174(A1) |
申请公布日期 |
2010.05.06 |
申请号 |
WO2009US61120 |
申请日期 |
2009.10.19 |
申请人 |
GENERAL ELECTRIC COMPANY;MANTKOWSKI, THOMAS, E. |
发明人 |
MANTKOWSKI, THOMAS, E. |
分类号 |
B01D53/68;B23P6/00;C23G5/028;F01D25/00 |
主分类号 |
B01D53/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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