TESTING DEVICE AND CIRCUIT MODULE

摘要

The device is provided with a first testing substrate and a second testing substrate that are disposed face-to-face, a first testing circuit that is provided on the surface of the first testing substrate that faces the second testing substrate in order to test a device under test, a second testing circuit that is provided on the surface of the second testing substrate that faces the first testing substrate in order to test the device under test, and a sealed part that seals off a space between the first testing substrate and the second testing substrate so as to seal the first testing circuit and the second testing circuit inside a common space, and wherein the common space is filled with a cooling material.