| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic component thrusting apparatus capable of quickly contacting a test objective electronic component with a testing socket at an appropriate pressure, and an IC handler provided with the thrusting apparatus. SOLUTION: A control device performs an IC arrangement step in which an IC chip is arranged in the testing socket (Step S11). When this is done, there is a fine clearance between each external terminal of the IC chip and each testing probe. Next, a low-pressure thrusting step is performed (Step S12). In the low-pressure thrusting step, a pneumatic piston is caused to contact each external terminal with each testing probe by a contacting thrust lower than an adequate thrust suitable for testing. At this contacting moment, the contacting thrust and a thrust consisting of an inertia force of the piston itself and an inertia force of the testing probe are eased from becoming excessive. Thereafter, it is detected in a statically determinate pressure detection step that the thrust has been statically determinated to be the contacting thrust (Step S14), and the contacting thrust is changed to the adequate thrust in a testing thrusting step (Step S15). COPYRIGHT: (C)2010,JPO&INPIT
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