发明名称 METHODS OF FORMING LAYERS OF SEMICONDUCTOR MATERIAL HAVING REDUCED LATTICE STRAIN, SEMICONDUCTOR STRUCTURES, DEVICES AND ENGINEERED SUBSTRATES INCLUDING SAME
摘要 Methods of fabricating semiconductor devices or structures include forming structures of a semiconductor material overlying a layer of a compliant material, subsequently changing the viscosity of the compliant material to relax the semiconductor material structures, and utilizing the relaxed semiconductor material structures as a seed layer in forming a continuous layer of relaxed semiconductor material. In some embodiments, the layer of semiconductor material may comprise a III-V type semiconductor material, such as, for example, indium gallium nitride. Novel intermediate structures are formed during such methods. Engineered substrates include a continuous layer of semiconductor material having a relaxed lattice structure.
申请公布号 US2010109126(A1) 申请公布日期 2010.05.06
申请号 US20090576116 申请日期 2009.10.08
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES, S.A. 发明人 ARENA CHANTAL
分类号 H01L21/20;H01L29/20 主分类号 H01L21/20
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