| 摘要 |
Apparatus and methods are described which are useful for determining a location characteristic between an RFID tag and an RFID tag reader or a second RFID tag. In various embodiments, signals backscattered from a singulated tag over a range of frequencies are evaluated for in-phase I and in-quadrature Q signal components. The I-Q data is processed to determine phase delay angles associated with each signal frequency. The phase delay data can be processed by a sum of squared errors method or Fourier transform method to determine a distance to the singulated tag. The methods can also be used to determine any of a location, a radial velocity, a directional velocity of the singulated tag, and proximity of the singulated tag to a second tag.
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