| 摘要 |
<p>Disclosed is a method of testing an integrated circuit (100) comprising a radio-frequency (RF) transceiver, said transceiver comprising a receiver chain (120) having an input for coupling the receiver chain to an antenna (112) and an output coupled to a digital signal processor (130), and a transmitter chain (140) having an input coupled to the digital signal processor (130) and an output for coupling the transmitter chain (140) to an antenna (114); and a RF calibration signal generator (170) for generating a RF calibration signal, the method comprising connecting the RF calibration signal generator (170) to the receiver chain input in a test mode; injecting a test signal comprising the RF calibration signal into the receiver chain input; collecting a response to the test signal from the receiver chain output; and evaluating said response. Further disclosed is an IC (100), comprise a BIST arrangement for executing said method.</p> |
