发明名称 METHOD OF DETACHING SEMI-CONDUCTOR LAYERS AT LOW TEMPERATURE
摘要 <p>The invention relates to a method for producing UTBOX type structures comprising: a) the assembly of a substrate, known as "donor" substrate (1), with a substrate, known as "receiver" substrate (2), at least one of the two substrates comprising an insulating layer (3) of thickness less than 50 nm, b) a first heat treatment for reinforcing the assembly between the two substrates, at temperature below 400°C, carried out during the assembly and/or after assembly, to reinforce said assembly, c) a second heat treatment at temperature above 900°C, the exposure time between 400°C and 900°C being less than 1 minute or 30 seconds.</p>
申请公布号 WO2010049497(A1) 申请公布日期 2010.05.06
申请号 WO2009EP64308 申请日期 2009.10.29
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES;LANDRU, DIDIER;RADU, IONUT;VINCENT, SEBASTIEN 发明人 LANDRU, DIDIER;RADU, IONUT;VINCENT, SEBASTIEN
分类号 H01L21/762 主分类号 H01L21/762
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