发明名称 SPUTTERING TARGET FOR FORMING WIRING FILM FOR THIN-FILM TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a sputtering target to form a wiring film and a wiring base film for a gate electrode, a source electrode, a drain electrode and so on of a thin-film transistor with superior adhesiveness. <P>SOLUTION: The sputtering target for forming a wiring film for a thin-film transistor contains 0.1-5 atom% Mg and 0.1-10 atom% Ca, and it contains 0.1-10 atom% of one kind or total of two kinds of Mn and Al if needed. Furthermore, it also contains 0.001-0.1 atom% P if needed, and its remaining portion includes a composition of Cu and unavoidable impurities. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010103331(A) 申请公布日期 2010.05.06
申请号 JP20080273938 申请日期 2008.10.24
申请人 MITSUBISHI MATERIALS CORP 发明人 MAKI KAZUMASA;KOIDE MASATO;MORI AKIRA;TANIGUCHI KENICHI;NAKAZATO YOSUKE
分类号 H01L21/285;H01L21/28;H01L21/3205;H01L21/336;H01L23/52;H01L29/786 主分类号 H01L21/285
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