发明名称 METHOD AND DEVICE FOR MEASURING RADIATION
摘要 <p><P>PROBLEM TO BE SOLVED: To suppress variations in measurement values when starting measurement. <P>SOLUTION: A semiconductor-type radiation detection element (2) is irradiated with high-energy X-rays (41) which pass through the radiation detection element (2). After finishing the irradiation, radiation being a measuring object is measured by the use of the radiation detection element (2). As a result of this, donors and acceptors being in ionic states diminish in portions of an i layer corresponding to the vicinities of electrodes on the incidence side of the radiation and on its opposite side, by the irradiation of the high-energy radiation. Consequently, even if radiation measurement is repeated after that, measurement values do not vary. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010101665(A) 申请公布日期 2010.05.06
申请号 JP20080271523 申请日期 2008.10.22
申请人 SHIMADZU CORP 发明人 YAMADA MINORU;SHIMADA MASARU;FUJII ATSUSHI
分类号 G01T1/24 主分类号 G01T1/24
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