发明名称 |
MODULE TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME |
摘要 |
A test system includes a host, a module to communicate with the host, and a test device to test the module while the module is connected to the host. The host includes a pulse width modulator circuit to supply a power to the module, and the test device varies a feedback resistance value provided to the pulse width modulator circuit.
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申请公布号 |
US2010115336(A1) |
申请公布日期 |
2010.05.06 |
申请号 |
US20090609263 |
申请日期 |
2009.10.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN DONG-EUN;LEE JUNGKUK;PARK JUNJUNG;HWANG DEOGJONG;YOU JAE CHUN |
分类号 |
G06F11/273 |
主分类号 |
G06F11/273 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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