发明名称 MODULE TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME
摘要 A test system includes a host, a module to communicate with the host, and a test device to test the module while the module is connected to the host. The host includes a pulse width modulator circuit to supply a power to the module, and the test device varies a feedback resistance value provided to the pulse width modulator circuit.
申请公布号 US2010115336(A1) 申请公布日期 2010.05.06
申请号 US20090609263 申请日期 2009.10.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN DONG-EUN;LEE JUNGKUK;PARK JUNJUNG;HWANG DEOGJONG;YOU JAE CHUN
分类号 G06F11/273 主分类号 G06F11/273
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