发明名称 Charged-particle optical system with dual specimen loading options
摘要 <p>A charged-particle optical system (100) such as an electron microscope has a vacuum chamber (102) with a space (104) for accommodating a specific one (114) of multiple specimens in operational use. The charged-particle optical system has a loader (106) with a part (108) that is moveable into and out of the space. The part is configured for attaching a specimen carrier (110), brought from outside the system, to a first holder (112) or to detach the carrier from the first holder and to remove the carrier from inside the system. The carrier accommodates a first specimen. The system has an interface (116) in a wall of the chamber for removably accommodating the first holder (112) or a second holder (118) with a second specimen (120) mounted thereon.</p>
申请公布号 EP2182545(A1) 申请公布日期 2010.05.05
申请号 EP20090174548 申请日期 2009.10.30
申请人 FEI COMPANY 发明人 VAN DEN OETELAAR, JOHANNES;HERMKENS, JORN;DONA, PLEUN;NEDERLOF, FRANK;WONDERGEM, WIM
分类号 H01J37/18;H01J37/26 主分类号 H01J37/18
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