| 摘要 |
<p>To provide a fluorescent X-ray analysis apparatus using a polarization for effectively measuring a minute portion of a sample surface without it being necessary to prepare many kinds of secondary targets, a fluorescent X-ray analysis apparatus according to the present invention includes an X-ray tube for generating an X-ray; a sample support portion for supporting a sample receiving the X-ray; a polarization filter for receiving an X-ray to be generated from the sample receiving the X-ray; and a detector for detecting the X-ray from the polarization filter. The X-ray tube, the sample, the polarization filter, and the detector are arranged so that three light paths, namely, a light path from the X-ray tube to the sample, a light path from the sample to the polarization filter, and a light path from the polarization filter to the detector are mutually orthogonal.</p> |
