发明名称 |
PROCESS FOR PRODUCING SILICON WAFER AND SILICON WAFER PRODUCED BY THE PROCESS |
摘要 |
There is obtained a silicon wafer which has a large diameter, where no slip generated therein in a wide range of a density of oxygen precipitates even though a heat treatment such as SLA or FLA is applied thereto, and which has high strength. First, by inputting as input parameters combinations of a plurality of types of oxygen concentrations and thermal histories set for manufacture of a silicon wafer , a Fokker-Planck equation is solved to calcurate each of a diagonal length L and a density D of oxygen precipitates in the wafer after a heat treatment step to form the oxygen precipitates (11) and immediately before a heat treatment step of a device manufacturing process is calculated. Then, a maximum heat stress S acting in a tangent line direction of an outer peripheral portion of the wafer in the heat treatment step of the device manufacturing process is calculated based on a heat treatment furnace structure and a heat treatment temperature used in the heat treatment step of the device manufacturing process, and then an oxygen concentration or the like satisfying the following Expression (1) is determined: 12000 × D - 0.26 ‰¦ L ‰¦ 51000 × S - 1.55 |
申请公布号 |
EP1780781(A4) |
申请公布日期 |
2010.05.05 |
申请号 |
EP20050753498 |
申请日期 |
2005.06.21 |
申请人 |
SUMCO CORPORATION |
发明人 |
SADAMITSU, S.;SUGIMURL, WATARU,;AKATSUKA, M.,;HOURAI, MASATAKA, |
分类号 |
H01L21/322;C30B29/06;C30B33/02;H01L27/12 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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