发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of the semiconductor device uses the gray-scale mask. Thereby, the ream of the photo mask is reduced. CONSTITUTION: A gate electrode layer(401) is formed on a substrate(400) having insulating surface. A gate isolation layer(402), an oxide semiconductor film, and a conductive film are successively formed on the gate electrode layer. The first mask layer is formed on the gate isolation layer, the oxide semiconductor film, and the conductive film. |
申请公布号 |
KR20100045926(A) |
申请公布日期 |
2010.05.04 |
申请号 |
KR20090100528 |
申请日期 |
2009.10.22 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA |
分类号 |
H01L29/786;G02F1/1368;H01L21/28;H01L21/3065;H01L21/336;H01L29/417;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|