发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of the semiconductor device uses the exposure mask having domain of a plurality of thicknesses formed with the gray-scale mask. The ream of the exposure mask can be reduced. CONSTITUTION: A gate electrode layer(401) is formed on the substrate having insulating surface. The gate isolation layer(402), and oxide semiconductor films(431, 432) and conductive film(433) are laminated on the gate electrode layer. The first mask layer is formed on the gate isolation layer, and the oxide semiconductor film and conductive film. |
申请公布号 |
KR20100045938(A) |
申请公布日期 |
2010.05.04 |
申请号 |
KR20090101176 |
申请日期 |
2009.10.23 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ITO SHUNICHI;HOSOBA MIYUKI;SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA |
分类号 |
H01L29/786;G02F1/136;G02F1/1368;H01L21/28;H01L21/3065;H01L21/336;H01L29/417;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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