发明名称 Methods and apparatus to monitor contamination levels in a formation fluid
摘要 Apparatus and methods to monitor contamination levels in a formation fluid arc disclosed. An example method involves obtaining first property data indicative of a first fluid property of a formation fluid and second property data indicative of a second fluid property of the formation fluid. A correlation between the first and second property data is generated and third data is fitted to the correlation. A fitting parameter is determined based on the third data indicative of an amount of change of the first property data relative to an amount of change of the second property data.
申请公布号 US7711488(B2) 申请公布日期 2010.05.04
申请号 US20070764284 申请日期 2007.06.18
申请人 SCHLUMBERGER TECHNOLOGY CORPORATION 发明人 HSU KAI;HEGEMAN PETER S.;DONG CHENGLI;VASQUES RICARDO
分类号 G01V8/00;E21B49/08;G01N21/00 主分类号 G01V8/00
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