| 摘要 |
PURPOSE: A jig for testing a substrate and an apparatus for testing a substrate including the same are provided to contact test probes to the testing point of a testing substrate by changing the location of the head of the jig. CONSTITUTION: The head of a test jig(30A) tests the wiring pattern of a substrate. A plurality of probes performs the test for the wiring pattern. A probe head(31) keeps the probes. A frame(45) keeps the probe head. A first transfer unit(42X) transfers the probe head to a first direction. A second transfer unit(42Y) transfers the probe head to a second direction. The second direction is different from the first direction.
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