发明名称 |
FUSE IN THE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A fuse in a semiconductor device and a method for manufacturing the same are provided to protect a barrier metal layer from exposing by forming an oxide layer on the sidewall of the barrier metal layer which is located on the lower side of a fuse pattern. CONSTITUTION: A barrier metal layer and a metal layer(215) are formed on the upper side of a first insulation layer(205). The metal layer and the barrier metal layer are patterned in order to form a fuse pattern(225). The sidewall of the patterned barrier metal layer is etched to form an under-cut. A protective layer fills the under-cut. A second insulation layer(235) is formed on the upper side of the protective layer. The first and the second insulation layers are selectively etched to form a fuse open region(250). |
申请公布号 |
KR20100044571(A) |
申请公布日期 |
2010.04.30 |
申请号 |
KR20080103760 |
申请日期 |
2008.10.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JEONG SOO;SHIN, WON HO |
分类号 |
H01L23/62 |
主分类号 |
H01L23/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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