发明名称 NONLINEAR OPTICAL MICROSCOPE AND METHOD FOR ADJUSTING SAME
摘要 PROBLEM TO BE SOLVED: To provide a nonlinear optical microscope that can surely maintain the efficiency of detecting light rays high, and to provide a method for adjusting the nonlinear optical microscope. SOLUTION: The nonlinear optical microscope includes a scanning means (16) that scans an object with spot of illuminating light formed by an objective lens (17), and a detection means (200) that detects signal light having nonlinear intensity relation to illuminating light from the spot on the object. A standardization beam diameter &phiv;=&phiv;<SB>f</SB>/&phiv;<SB>o</SB>that is a ratio of a pupil diameter &phiv;<SB>o</SB>of the objective lens to a luminous flux diameter &phiv;<SB>f</SB>of the illuminating light projected to the objective lens is set to be near a specified value that gives a peak to the intensity of the signal light under a condition that power of the illuminating light going toward the objective lens is constant. COPYRIGHT: (C)2010,JPO&amp;INPIT
申请公布号 JP2010096813(A) 申请公布日期 2010.04.30
申请号 JP20080264946 申请日期 2008.10.14
申请人 NIKON CORP 发明人 NISHIMURA KUMIKO
分类号 G02B21/00;G01N21/64;G02F1/35 主分类号 G02B21/00
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