发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a further improved semiconductor device using a bulk silicon wafer without using an expensive SOI wafer. SOLUTION: The method of manufacturing the semiconductor device comprises: forming buffer layers 12, 14 on a semiconductor substrate 10; patterning the buffer layer in a first direction to form buffer layer patterns being spaced from each other at predetermined intervals; forming a semiconductor epitaxial layer 18 on and between the buffer layer patterns; forming a first trench 300 in a second direction perpendicular to the first direction to expose lateral surfaces of the buffer layer patterns; selectively removing the buffer layer patterns exposed by the first trench; forming buried insulating films 22 in the spaces formed by removal of the buffer layer patterns; removing a portion of the semiconductor epitaxial layer disposed between the buried insulating films to form a second trench 400 in the first direction; and forming device isolation films 300a, 400a in the first and second trenches. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010098277(A) 申请公布日期 2010.04.30
申请号 JP20090004552 申请日期 2009.01.13
申请人 HYNIX SEMICONDUCTOR INC 发明人 YOO MIN SOO
分类号 H01L21/8242;H01L21/76;H01L21/762;H01L27/10;H01L27/108;H01L27/12 主分类号 H01L21/8242
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