发明名称 CHEMICAL MECHANICAL POLISHING PAD HAVING INTEGRALLY MOLDED IDENTIFICATION MECHANISM
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad having a polishing layer whose polishing surface is adapted to polish a substrate. <P>SOLUTION: A polishing layer 10 has an integrally molded identification mechanism; the integrally molded identification mechanism is non-polishing active and has at least two visually different characteristics, at least one of which is marked with a non-color base and at least one of which is marked with a color base; and the at least two visually different characteristics allow a chemical mechanical polishing pad to be uniquely identified and selected as a type of chemical mechanical polishing pad from among multiple chemical mechanical polishing pads, thus the polishing layer having the polishing surface to be adapted to polish a substrate. In addition, methods for producing such a polishing layer and for polishing a substrate using the same are provided. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010094803(A) 申请公布日期 2010.04.30
申请号 JP20090237829 申请日期 2009.10.15
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 KULP MARY JO;STRING DARRELL
分类号 B24B37/00;B24B37/04;H01L21/304 主分类号 B24B37/00
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