发明名称 |
CHEMICAL MECHANICAL POLISHING PAD HAVING INTEGRALLY MOLDED IDENTIFICATION MECHANISM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad having a polishing layer whose polishing surface is adapted to polish a substrate. <P>SOLUTION: A polishing layer 10 has an integrally molded identification mechanism; the integrally molded identification mechanism is non-polishing active and has at least two visually different characteristics, at least one of which is marked with a non-color base and at least one of which is marked with a color base; and the at least two visually different characteristics allow a chemical mechanical polishing pad to be uniquely identified and selected as a type of chemical mechanical polishing pad from among multiple chemical mechanical polishing pads, thus the polishing layer having the polishing surface to be adapted to polish a substrate. In addition, methods for producing such a polishing layer and for polishing a substrate using the same are provided. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010094803(A) |
申请公布日期 |
2010.04.30 |
申请号 |
JP20090237829 |
申请日期 |
2009.10.15 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC |
发明人 |
KULP MARY JO;STRING DARRELL |
分类号 |
B24B37/00;B24B37/04;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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