| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an address line of flash memory for shortening the testing time, a testing method of a testing device, and the testing device. Ž<P>SOLUTION: This testing method includes a first process of setting all storages as a first data value, a second process of setting a specific address line as a first address value, setting the other address lines as a second address value, setting a specific storage of the storage unit indicated by the set address as a second data value, and performing writing of setting the other storages as the first data value for each storage, a third process of setting address lines other than the specific address line as the first address value, and performing the second process using the storages of the position on the storage unit different from that of the specific storage as the second data value, and a fourth process of repeating the second process and the third process and then inspecting the storage unit indicated by the address where all address lines are set as the second address value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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