| 摘要 |
PROBLEM TO BE SOLVED: To implement a probe for waveform measuring apparatuses for accurately transmitting signals of an object to be measured with the probe itself not affecting the object to be measured in a wide band. SOLUTION: This invention is obtained by improving a probe for transmitting electric signals of an object to be measured to a waveform measuring apparatus. The probe includes: a tip part electrically connected to the object to be measured and having the frequency characteristics of gain; a cable part for transmitting electric signals from the tip part; and an amplifier part for receiving input of electric signals from the cable part at an input terminal, compensating for the frequency characteristics of gain of the tip part, and outputting them from an output terminal to the waveform measuring apparatus. The amplifier part includes: an inverting amplifier circuit having an operational amplifier in which electric signals to a negative input terminal are galvanically isolated and of which an output terminal is connected to an output terminal of the amplifier part; resistors serially connected between the input terminal and the output terminal of the amplifier part; and a bias circuit for outputting an input bias current to the negative input terminal of the operational amplifier of the inverting amplifier circuit on the basis of a voltage of a node between the serially connected resistors. COPYRIGHT: (C)2010,JPO&INPIT
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