发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a semiconductor device is provided to improve the uniformity of line widths by forming fine patterns without a deposition process. CONSTITUTION: A sacrificial layer is formed on a semiconductor substrate. A photo-resist pattern(120) is formed on the upper side of the sacrificial layer. A pre-set depth of the sacrificial layer is etched using the photo-resist pattern as an etching mask. A resist enhancement lithography assisted by chemical shrink(RELACS) patterns(122) are formed on the surface of the photo-resist layer. A gap fill material(124) is formed to fill the space between the RELACS patterns. The RELACS patterns are removed.
|
申请公布号 |
KR20100044572(A) |
申请公布日期 |
2010.04.30 |
申请号 |
KR20080103761 |
申请日期 |
2008.10.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HEO, JUNG GUN;BAN, KEUN DO;BOK, CHEOL KYU;LEE, KI LYOUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|