发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a semiconductor device is provided to improve the uniformity of line widths by forming fine patterns without a deposition process. CONSTITUTION: A sacrificial layer is formed on a semiconductor substrate. A photo-resist pattern(120) is formed on the upper side of the sacrificial layer. A pre-set depth of the sacrificial layer is etched using the photo-resist pattern as an etching mask. A resist enhancement lithography assisted by chemical shrink(RELACS) patterns(122) are formed on the surface of the photo-resist layer. A gap fill material(124) is formed to fill the space between the RELACS patterns. The RELACS patterns are removed.
申请公布号 KR20100044572(A) 申请公布日期 2010.04.30
申请号 KR20080103761 申请日期 2008.10.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HEO, JUNG GUN;BAN, KEUN DO;BOK, CHEOL KYU;LEE, KI LYOUNG
分类号 H01L21/027 主分类号 H01L21/027
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