发明名称 |
PHASE CHANGE RAM DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A phase change ram device and a method for manufacturing the same are provided to prevent the oxidation of a phase change layer by preventing the penetration of oxygen of an interlayer oxide layer to the phase change layer. CONSTITUTION: A phase change layer(110) is formed on the upper side of a semiconductor substrate. A stacked pattern is composed of the phase change layer and an upper electrode. An anti-reflection layer(122) is formed on the upper side of the upper electrode. A capping layer(130) is formed on the both wall of the phase change layer. A heat transmissive thin film including the capping layer is formed on the entire surface of the phase change layer, the stacked pattern of an upper electrode and an anti-reflection layer.
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申请公布号 |
KR20100043896(A) |
申请公布日期 |
2010.04.29 |
申请号 |
KR20080103141 |
申请日期 |
2008.10.21 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, BYUNG JICK;RYU, IN CHEOL |
分类号 |
H01L21/8247 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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