发明名称 PHASE CHANGE RAM DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A phase change ram device and a method for manufacturing the same are provided to prevent the oxidation of a phase change layer by preventing the penetration of oxygen of an interlayer oxide layer to the phase change layer. CONSTITUTION: A phase change layer(110) is formed on the upper side of a semiconductor substrate. A stacked pattern is composed of the phase change layer and an upper electrode. An anti-reflection layer(122) is formed on the upper side of the upper electrode. A capping layer(130) is formed on the both wall of the phase change layer. A heat transmissive thin film including the capping layer is formed on the entire surface of the phase change layer, the stacked pattern of an upper electrode and an anti-reflection layer.
申请公布号 KR20100043896(A) 申请公布日期 2010.04.29
申请号 KR20080103141 申请日期 2008.10.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, BYUNG JICK;RYU, IN CHEOL
分类号 H01L21/8247 主分类号 H01L21/8247
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