发明名称 PROCESS KIT HAVING REDUCED EROSION SENSITIVITY
摘要 Process kits for use in a semiconductor process chambers have been provided herein. In some embodiments, a process kit for a semiconductor process chamber includes a body configured to rest about a periphery of a substrate support and having sidewalls defining an opening corresponding to a central region of the substrate support. A lip extends from the sidewalls of the body into the opening, wherein a portion of an upper surface of the lip is configured to be disposed beneath a substrate during processing. A first distance measured between opposing sidewalls of the body is greater than a width across the upper surface of a substrate to be disposed within the opening by at least about 7.87 mm.
申请公布号 US2010101729(A1) 申请公布日期 2010.04.29
申请号 US20080259981 申请日期 2008.10.28
申请人 APPLIED MATERIALS, INC. 发明人 KIM JONG MUN;ZHAO XIAOYE;KENNEY JASON ANDREW;RAUF SHAHID
分类号 H01L21/3065 主分类号 H01L21/3065
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