发明名称 |
Verfahren zur Herstellung eines Halbleiterbauelements umfassend ein chemisch-mechanisches Mehrschrittpolierverfahren für einen Gatebereich in einem FINFET |
摘要 |
A method of manufacturing a MOSFET type semiconductor device includes planarizing a gate material layer that is deposited over a channel. The planarization is performed in a multi-step process that includes an initial "rough" planarization and then a "fine" planarization. The slurry used for the finer planarization may include added material that tends to adhere to low areas of the gate material. |
申请公布号 |
DE112004001041(B4) |
申请公布日期 |
2010.04.29 |
申请号 |
DE20041101041T |
申请日期 |
2004.06.05 |
申请人 |
ADVANCED MICRO DEVICES INC. |
发明人 |
ACHUTHAN, KRISHNASHREE;AHMED, SHIBLY S.;WANG, HAIHONG;YU, BIN |
分类号 |
H01L21/336;C09G1/02;H01L21/302;H01L21/3105;H01L21/321;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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