发明名称 Verfahren zur Herstellung eines Halbleiterbauelements umfassend ein chemisch-mechanisches Mehrschrittpolierverfahren für einen Gatebereich in einem FINFET
摘要 A method of manufacturing a MOSFET type semiconductor device includes planarizing a gate material layer that is deposited over a channel. The planarization is performed in a multi-step process that includes an initial "rough" planarization and then a "fine" planarization. The slurry used for the finer planarization may include added material that tends to adhere to low areas of the gate material.
申请公布号 DE112004001041(B4) 申请公布日期 2010.04.29
申请号 DE20041101041T 申请日期 2004.06.05
申请人 ADVANCED MICRO DEVICES INC. 发明人 ACHUTHAN, KRISHNASHREE;AHMED, SHIBLY S.;WANG, HAIHONG;YU, BIN
分类号 H01L21/336;C09G1/02;H01L21/302;H01L21/3105;H01L21/321;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L21/336
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