ELECTRONIC CIRCUIT AND COMMUNICATION FUNCTION INSPECTION METHOD

摘要

Provided is an electronic circuit which can easily test a semiconductor chip for performing communication by inductive coupling.  Provided is also a method for inspecting the electronic circuit. The electronic circuit includes: a first substrate; a first transmission coil formed by a wire arranged on the first substrate for transmitting a signal; a first transmission circuit which transmits a signal to the first transmission coil; a first reception coil formed by a wire at the position of the inductive coupling with the first transmission coil so as to receive the signal from the first transmission coil; a first reception circuit which inputs the signal from the first reception coil; and a first check circuit which compares the data inputted to the first transmission circuit to the data outputted from the first reception circuit.