发明名称 Hardware and Method to Test Phase Linearity of Phase Synthesizer
摘要 A circuit to test phase linearity of a phase synthesizer, which synthesizes an output clock having a phase corresponding to a digital phase value input to the phase synthesizer. A digital counter provides the digital phase value to the phase synthesizer. The digital counter receives a counter clock synchronized with an input clock. The digital phase value is stepped by the digital counter, thereby shifting the frequency of the output clock. The output clock is analyzed with respect to phase linearity of the phase synthesizer to produce a phase linearity analysis output.
申请公布号 US2010102868(A1) 申请公布日期 2010.04.29
申请号 US20080531830 申请日期 2008.03.14
申请人 KIM JAEHA;LEE HAE-CHANG;GREER III THOMAS H 发明人 KIM JAEHA;LEE HAE-CHANG;GREER, III THOMAS H.
分类号 G06F1/04 主分类号 G06F1/04
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