| 摘要 |
An apparatus and method for inspecting a structure are provided which include receiving probes and area transducers disposed proximate opposite surfaces of a structure under inspection. An area transducer uniformly emits ultrasonic signals over an area which may be scanned by a receiving probe without corresponding movement of the area transducer. An area transducer may be moved over the surface of the structure or repositioned to provide additional inspection area for the receiving probe to scan, including to provide for continuous inspection. Multiple area transducers may be used in sequence to provide for continuous inspection. Multiple receiving probes may be used, independently or collectively as an array, to increase inspection of a structure, taking advantage of the large area of ultrasonic signals emitted by one or more area transducers.
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