发明名称 Deterministic test strand unparking
摘要 A circuit for deterministic unparking of a strand of a microprocessor having multiple clock domains is described. The circuit includes a first flip-flop and a second flip-flop. Each flip-flop has a data input connected to receive a respective unpark signal, a clock signal at respective clock frequencies, and a respective enable signal. Each enable signal is generated by a respective logic block, each including a counter and each operating at a respective one of the clock frequencies. The second flip-flop has a data input connected to an output of the first flip-flop, and outputs an unpark signal that is used to unpark a strand of the microprocessor in a deterministic manner.
申请公布号 US7707448(B1) 申请公布日期 2010.04.27
申请号 US20070744052 申请日期 2007.05.03
申请人 ORACLE AMERICA, INC. 发明人 KIM HAN BIN;IM YONGHEE;CHIU FRANK C.
分类号 G06F1/12;G01R31/28 主分类号 G06F1/12
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