发明名称 METHOD FOR RAPID ANALYSIS OF MECHANICAL SURFACE TENSIONS OF POLYCRYSTALLINE MATERIALS AND PARAMETRES OF THEIR CRYSTAL LATITUDE, AND DEVICE FOR ITS IMPLEMENTATION
摘要 FIELD: measurement technique. ^ SUBSTANCE: using: for determination of residual and operative surface tensions of polycrystalline materials and parametres of their crystal latitude. Investigated object is irradiated by narrow beam of radiac or X-ray radiation, M sections are separated from stream of reflected quanta, the quanta which hit each section within radiation period are recorded, reflected quanta distribution pattern is generated and value of determined parametre is calculated. Herewith, each of M separated from reflected quanta stream sections is assigned individual position code uniquely determined by its spatial coordinates among the rest separated sections. This code (when reflected quantum section is hit) is converted into code of its coordinates and immediately used to generate distribution pattern of reflected quanta and subsequent calculation of residual and operative surface tensions of polycrystalline materials and parametres of their crystal latitude. ^ EFFECT: simplification and acceleration of residual and operative surface tensions of polycrystalline materials and parametres of their crystal latitude determination. ^ 7 cl, 2 dwg
申请公布号 RU2387980(C1) 申请公布日期 2010.04.27
申请号 RU20080136576 申请日期 2008.09.11
申请人 KALMYKOV EHRNST ALEKSEEVICH;TORUBAROV ANATOLIJ MIKHAJLOVICH 发明人 KALMYKOV EHRNST ALEKSEEVICH;TORUBAROV ANATOLIJ MIKHAJLOVICH
分类号 G01N23/20 主分类号 G01N23/20
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