发明名称 METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM
摘要 An inspection region is specified using the design information to perform region division for measurement through a scatterometry method. The obtained detection data is classified by pattern into a periodic region and a non-periodic region. A spectroscopic characteristic is detected by an optical sensor to extract features. The extracted features are compared with features stored in a feature map database for each region to evaluate a state of a patterned medium.
申请公布号 US2010098320(A1) 申请公布日期 2010.04.22
申请号 US20090482126 申请日期 2009.06.10
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SASAZAWA HIDEAKI;HIROSE TAKENORI;YOSHIDA MINORU;SAITO KEIYA;SERIKAWA SHIGERU
分类号 G06K9/00 主分类号 G06K9/00
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