| 摘要 |
A semiconductor integrated circuit includes a clock generator for generating a second clock signal having a frequency that varies over time by using a first clock signal having a fixed frequency, a test circuit for generating a digital signal according to a difference between a first frequency corresponding to the first clock signal and a second frequency corresponding to the second clock signal by a digital logic operation based on the first clock signal and the second clock signal, and a signal path for outputting the digital signal generated by the test circuit.
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