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发明名称
Verfahren zur Prüfung von einer integrierten Schaltung
摘要
申请公布号
DE50115381(D1)
申请公布日期
2010.04.22
申请号
DE20015015381
申请日期
2001.12.04
申请人
ATMEL GERMANY GMBH;VISHAY SEMICONDUCTOR GMBH
发明人
EICHIN, MATTHIAS;KURZ, ALEXANDER
分类号
G01R31/28;G11C29/00;G01R31/3185;G11C29/46;G11C29/48;H01L21/822;H01L27/04
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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