发明名称 POWER SEMICONDUCTOR MODULE
摘要 <P>PROBLEM TO BE SOLVED: To prevent a crack in a soldered portion of a power semiconductor module even when a temperature cycle is exerted to the power semiconductor module, and also to prevent growth of the crack even if the crack is generated. <P>SOLUTION: The power semiconductor module includes: an insulating substrate 2 including an insulating board 13 and a wiring layer 12 provided on the main surface of the insulating board; a semiconductor device fixed on the wiring layer; and an internal electrode 9 which has a joint surface substantially parallel to the main surface of the insulating board and whose joint surface is bonded to the wiring layer with the solder layer 10. The internal electrode has a plurality of striped upper projections 21 arranged in approximately parallel on the joint surface covered with the solder layer and the wiring layer has a plurality of striped lower projections arranged in approximately parallel in the region covered with the solder layer. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010093287(A) 申请公布日期 2010.04.22
申请号 JP20090286738 申请日期 2009.12.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 MORISHITA KAZUHIRO;UMEZAKI ISAO
分类号 H01L23/12;H01L25/07;H01L25/18 主分类号 H01L23/12
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