发明名称 PATTERN CHECK DEVICE AND PATTERN CHECK METHOD
摘要 <p>A pattern check device (1) includes: an image acquisition unit (101) which acquires an image of an examinee having a plurality of types of biometric patterns; a separation/extraction unit (102) which separate and extracts each of the plurality of biometric patterns from the image; and a check unit (103) which compares the separated and extracted plurality of types of biometric patterns to corresponding biometric information for check registered in advance so as to derive a plurality of check results.</p>
申请公布号 WO2010044250(A1) 申请公布日期 2010.04.22
申请号 WO2009JP05326 申请日期 2009.10.13
申请人 NEC CORPORATION;NAKAMURA, YOICHI;KAMEI, TOSHIO 发明人 NAKAMURA, YOICHI;KAMEI, TOSHIO
分类号 G06T7/00;A61B5/117;G06T1/00 主分类号 G06T7/00
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