发明名称 |
PATTERN CHECK DEVICE AND PATTERN CHECK METHOD |
摘要 |
<p>A pattern check device (1) includes: an image acquisition unit (101) which acquires an image of an examinee having a plurality of types of biometric patterns; a separation/extraction unit (102) which separate and extracts each of the plurality of biometric patterns from the image; and a check unit (103) which compares the separated and extracted plurality of types of biometric patterns to corresponding biometric information for check registered in advance so as to derive a plurality of check results.</p> |
申请公布号 |
WO2010044250(A1) |
申请公布日期 |
2010.04.22 |
申请号 |
WO2009JP05326 |
申请日期 |
2009.10.13 |
申请人 |
NEC CORPORATION;NAKAMURA, YOICHI;KAMEI, TOSHIO |
发明人 |
NAKAMURA, YOICHI;KAMEI, TOSHIO |
分类号 |
G06T7/00;A61B5/117;G06T1/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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