| 摘要 |
In order to determine electrical properties of an electrical device (10), one measurement (110) of an electrical measurement variable is carried out at each of at least one outgoing electrical connection (46, 48) of each of a plurality of equipotential elements (20, 26) of the electrical device (10). The measurement (110) of the electrical measurement variable of specific equipotential elements (20) is not carried out at at least one other outgoing electrical connection (46) of the respective equipotential element (20) if, in the area of said other connection (60), an optionally recognized error of the respective equipotential element (20) influences the electrical measurement variable (C) to a degree that is greater than a tolerance magnitude of the measurement (110) of said measurement variable (C). In another method for determining electrical properties of an electrical device (10), a temporary electrical connection (144) is made between two or more respective equipotential elements (20, 35) during individual measurements by way of an electrical component (144) and a common measurement (110) is performed at the respective temporarily electrically connected equipotential elements (20, 35). The invention further relates to a device (64) for carrying out the respective method (103). |
