发明名称 IMAGING DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT FOR THE SAME, AND METHOD OF DETERMINING DEFECTIVE PIXEL
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that a defective pixel position cannot be detected and a high-frequency component is excessively compensated when light is not shielded. Ž<P>SOLUTION: A detection means 101 detects a defective pixel candidate from among a plurality of pixels for each or several frames based on a signal difference between each pixel of an imaging element 107 and a peripheral pixel thereof. A storage means 105 stores pixel positions of the defective pixel candidates sequentially detected by the detection means 101 on a detection basis. A measurement means 103 reads the pixel positions of the defective pixel candidates sequentially detected by the detection means 101 from the storage means 105, and measures the number of times that the each pixel is detected as the defective pixel candidate, for each pixel. A determination means 104 determines whether each pixel is defective based on the number of detections. Compensation means 106, 119 compensate pixel data of the pixels determined to be defective based on the pixel data of the peripheral pixels thereof. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010093471(A) 申请公布日期 2010.04.22
申请号 JP20080260433 申请日期 2008.10.07
申请人 PANASONIC CORP 发明人 YOSHIKAWA HIRONORI;NAKAMURA KENJI
分类号 H04N5/335;H04N5/367 主分类号 H04N5/335
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