发明名称 METHOD AND DEVICE FOR DETECTING FOREIGN MATTER
摘要 PROBLEM TO BE SOLVED: To set automatically a weighting parameter for optimum differential processing in accordance with a dual-energy X-ray image of a measuring object so that stable and highly-sensitive foreign matter detection can be performed easily. SOLUTION: An image processing means (6) includes an equivalent thickness image generation means (61) for generating an equivalent thickness image pair of low energy and high energy from the dual-energy X-ray image, a separation matrix calculation means (63) for determining a separation matrix by applying independent component analysis to separate the equivalent thickness image pair into a component of a mixed foreign matter and a component of the measuring object, a parameter calculation means (64) for determining the weighing parameter for differential processing based on two separation vectors which are elements of the separation matrix, a foreign matter component image separation means (67) for separating a component image of the contaminated foreign matter from the equivalent thickness image pair by the differential processing using the weighing parameter, and a foreign matter detection means (68) for detecting a foreign matter by subjecting the component image of the contaminated foreign matter to threshold processing. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010091483(A) 申请公布日期 2010.04.22
申请号 JP20080263207 申请日期 2008.10.09
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 YAMAZAKI MASAHIDE;UEDA KIYOTAKE
分类号 G01N23/04 主分类号 G01N23/04
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