发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including a thin film transistor with excellent electrical characteristics and high reliability, and to provide a method for manufacturing the semiconductor device with high mass productivity. <P>SOLUTION: The gist includes: to form a low-resistance oxide semiconductor layer as a source or drain region after forming a drain or source electrode layer over a gate insulating layer; and then to form an oxide semiconductor film thereover as a semiconductor layer. It is preferable that an oxygen-excess oxide semiconductor layer is used as a semiconductor layer and an oxygen-deficient oxide semiconductor layer is used as a source region and a drain region. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010093238(A) |
申请公布日期 |
2010.04.22 |
申请号 |
JP20090206653 |
申请日期 |
2009.09.08 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;AKIMOTO KENGO;KOMORI SHIGEKI;UOJI HIDEKI |
分类号 |
H01L29/786;G02F1/1368;G09F9/30;H01L21/28;H01L21/336;H01L21/363;H01L29/417;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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