发明名称 SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including a thin film transistor with excellent electrical characteristics and high reliability, and to provide a method for manufacturing the semiconductor device with high mass productivity. <P>SOLUTION: The gist includes: to form a low-resistance oxide semiconductor layer as a source or drain region after forming a drain or source electrode layer over a gate insulating layer; and then to form an oxide semiconductor film thereover as a semiconductor layer. It is preferable that an oxygen-excess oxide semiconductor layer is used as a semiconductor layer and an oxygen-deficient oxide semiconductor layer is used as a source region and a drain region. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010093238(A) 申请公布日期 2010.04.22
申请号 JP20090206653 申请日期 2009.09.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;AKIMOTO KENGO;KOMORI SHIGEKI;UOJI HIDEKI
分类号 H01L29/786;G02F1/1368;G09F9/30;H01L21/28;H01L21/336;H01L21/363;H01L29/417;H01L51/50 主分类号 H01L29/786
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