| 摘要 |
The invention relates to a calibration substrate (100) having at least one calibration standard (12, 14, 16; 102, 104, 108) comprising at least two electrical connection points, each for one measurement gate (38, 42) of a vector network analyzer (40). According to the invention, at least one electrical connection point is formed of at least one calibration standard (12, 14, 16; 102, 104, 108) having a switch (20, 22, 24), wherein the switch (20, 22, 24) comprises a first electrical contact (30) electrically connected to an electrical connection point of the calibration standard (12, 14, 16; 102, 104, 108), a second electrical contact (32) designed for electrically connecting to a measurement gate (38, 42) of the vector network analyzer (40), and a third electrical contact (34), wherein the switch (20, 22, 24) is designed such that an electrical contact is established either between the first and third electrical contact (30, 34) or between the first and second electrical contact (30, 32). |
